Teradyne, Inc. Description
Teradyne, Inc. provides automatic test equipment worldwide. The company operates in three segments: Semiconductor Test, Systems Test Group, and Wireless Test. The Semiconductor Test segment designs, manufactures, sells, and supports semiconductor test products and services for wafer level and device package testing primarily in automotive, industrial, communications, consumer, computer, and electronic game applications. This segment offers FLEX test platform systems; Magnum test platform that tests memory devices, such as flash memory and dynamic random access memory; and ETS platform for use by semiconductor manufacturers, and assembly and test subcontractors in the low pin count analog/mixed signal discrete markets. It serves integrated device manufacturers (IDMs) that integrate the fabrication of silicon wafers into their business; fabless companies, which outsource the manufacturing of silicon wafers; foundries that cater to the processing and manufacturing of silicon wafers; and outsourced semiconductor assembly and test providers, which offer test and assembly services for the final packaged devices to fabless companies and IDMs. The Wireless Test segment designs, develops, and supports wireless test solutions for developing and manufacturing wireless devices, including smart phones, tablets, notebooks/laptops, personal computer peripherals, and other Wi-Fi and cellular enabled devices. This segment offers solution for testing GSM, EDGE, W-CDMA, HSPA+, cdma2000, and LTE technologies for calibration and verification of smartphones, tablets, and embedded cellular modules; and a range of hardware and software solutions for connectivity testing. The Systems Test Group segment offers military/aerospace test instrumentation and systems; storage test systems for hard disk drive manufacturers; and circuit-board test and inspection systems for electronics manufacturers. Teradyne, Inc. was founded in 1960 and is headquartered in North Reading, Massachusetts.
Semiconductor Equipment & Materials
Semiconductor Device Fabrication
Hard Disk Drive
Dynamic Random Access Memory
Integrated Device Manufacturer
Automatic Test Equipment