AEHR Stock Discussion
Aehr Test Systems Description
Aehr Test Systems designs, develops, engineers, manufactures, and sells test and burn-in equipment systems that are used in the semiconductor industry worldwide. The company's systems are used to simultaneously perform parallel testing and burn-in of packaged integrated circuits (ICs), singulated bare die, or ICs still in wafer form. Its principal products include the Advanced Burn-in and Test System, a system to test and burn-in high-power logic and low-power ICs; the FOX full wafer contact parallel test and burn-in systems that are designed to make contact with various pads of a wafer simultaneously, which enables full wafer parallel test and burn-in; and the MAX burn-in systems that are designed for monitored burn-in of memory and logic devices. The company also provides WaferPak full wafer contactor, a cartridge system, which includes a full-wafer probe card for use in testing wafers in FOX systems; the DiePak carrier, a reusable, temporary package that enables IC manufacturers to perform final test and burn-in of bare die; and test fixtures that include burn-in board for the ABTS parallel test and burn-in system, and the MAX monitored burn-in system. In addition, it provides customer service and support programs, including system installation, system repair, applications engineering support, spare parts inventories, customer training, and documentation. The company markets its products through a network of distributors and sales representatives to semiconductor manufacturers, semiconductor contract assemblers, electronics manufacturers, and burn-in and test service companies. Aehr Test Systems was founded in 1977 and is headquartered in Fremont, California.
Industry: Semiconductor Equipment & Materials
Keywords: Semiconductor Electronics Integrated Circuits Electrical Engineering Electronic Engineering Semiconductor Device Fabrication Wafer Electronics Manufacturers Test Systems Semiconductor Manufacturers Equipment Systems Probe Card Burn In Systems Wafer Level Packaging Wafer Testing
Recent Comments
- TraderMike on BOOT
- Dr_Duru on BOOT
- TraderMike on Stochastic Reached Oversold
- SuccessfulGrasshopper897 on Stochastic Reached Oversold
- Cos3 on Adding float as advanced filter criteria?
From the Blog
Popular Now
Featured Articles