Automatic Test Equipment Stocks List
Symbol | Grade | Name | % Change | |
---|---|---|---|---|
TER | D | Teradyne, Inc. | 2.55 | |
INTT | C | inTest Corporation | -2.05 |
Related Industries: Semiconductor Equipment & Materials Semiconductors
Related Stock Lists:
Semiconductor
Semiconductor Device Fabrication
Semiconductor Manufacturers
Wafer
Aerospace
Automatic Testing Equipment
Calibration
Cdma
Computer Peripherals
Device Manufacturers
Disk Drive
Dynamic Random Access Memory
Electrical Products
Electronic Components
Electronics Manufacturers
Electronics Manufacturing
Fabless Manufacturing
Flash
Flash Memory
Gsm
Related ETFs - A few ETFs which own one or more of the above listed Automatic Test Equipment stocks.
Symbol | Grade | Name | Weight | |
---|---|---|---|---|
ARKQ | A | ARK Autonomous Technology & Robotics ETF | 7.15 | |
ARKX | A | ARK Space Exploration & Innovation ETF | 5.43 | |
SPRX | A | Spear Alpha ETF | 4.99 | |
FBOT | A | Fidelity Disruptive Automation ETF | 3.53 | |
TOLL | C | Tema Monopolies and Oligopolies ETF | 2.7 |
Compare ETFs
Date | Stock | Title |
---|---|---|
Nov 22 | TER | Teradyne (TER) Down 4.7% Since Last Earnings Report: Can It Rebound? |
Related Industries:
Semiconductor Equipment & Materials
Semiconductors
Related Stock Lists:
Semiconductor
Semiconductor Device Fabrication
Semiconductor Manufacturers
Wafer
Aerospace
Automatic Testing Equipment
Calibration
Cdma
Computer Peripherals
Device Manufacturers
Disk Drive
Dynamic Random Access Memory
Electrical Products
Electronic Components
Electronics Manufacturers
Electronics Manufacturing
Fabless Manufacturing
Flash
Flash Memory
Gsm
- Automatic Test Equipment
Automatic test equipment or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the device under test (DUT), equipment under test (EUT) or unit under test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer-controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on wafer testing, including system on chips and integrated circuits.
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