Probe Card Stocks List
Symbol | Grade | Name | % Change | |
---|---|---|---|---|
FORM | A | FormFactor, Inc. | 0.20 | |
INTT | F | inTest Corporation | -1.58 | |
AEHR | F | Aehr Test Systems | -2.00 |
Related Industries: Semiconductor Equipment & Materials Semiconductors
Related Stock Lists:
Semiconductor
Semiconductor Device Fabrication
Semiconductor Manufacturers
Integrated Circuits
Wafer
Wafer Testing
Automatic Test Equipment
Automatic Testing Equipment
Burn In Systems
Card Products
Computer Data
Computer Memory
DDR3 SDRAM
Dynamic Random Access Memory
Electrical Engineering
Electrical Products
Electronic Components
Electronic Engineering
Electronics
Electronics Manufacturers
Symbol | Grade | Name | Weight | |
---|---|---|---|---|
PSI | C | PowerShares Dynamic Semiconductors | 2.96 | |
PSCT | C | PowerShares S&P SmallCap Information Technology Portfolio | 2.49 | |
XSMO | A | Invesco S&P SmallCap Momentum ETF | 0.84 | |
IJT | A | iShares S&P SmallCap 600 Growth ETF | 0.69 | |
SLYG | A | SPDR S&P 600 Small Cap Growth ETF (based on S&P SmallCap 600 Growth Index) | 0.6 |
Compare ETFs
Related Industries:
Semiconductor Equipment & Materials
Semiconductors
Related Stock Lists:
Semiconductor
Semiconductor Device Fabrication
Semiconductor Manufacturers
Integrated Circuits
Wafer
Wafer Testing
Automatic Test Equipment
Automatic Testing Equipment
Burn In Systems
Card Products
Computer Data
Computer Memory
DDR3 SDRAM
Dynamic Random Access Memory
Electrical Engineering
Electrical Products
Electronic Components
Electronic Engineering
Electronics
Electronics Manufacturers
- Probe Card
A probe card is a device used to make electrical contact with the terminals of an integrated circuit (IC) or other small electronic device for the purpose of testing it. It is typically used in automated test equipment (ATE) to test the functionality of the IC. The probe card typically contains a number of probes, which are spring-loaded pins that make contact with the IC's terminals. The probe card also contains circuitry to route the signals from the IC to the ATE.
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